21. Digital hardware testing. transistor-level fault modeling and testing
Author: Rajsuman, Rochit., Rochit Rajsuman
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
Classification :
TK
7888
.
4
.
R35
22. Essentials of digital signal processing using matlab
Author: vinay k.lngle, john g.proakis
Library: Central Library and Information Center of Shahed University (Tehran)
Subject: Integrated circuits- Very large scale integration -- Testing,Digital integrated circuits -- Testing,Mixed signal circuits -- Testing,Semiconductor storage devices -- Testing
Classification :
TK
،
7874
,.
75
،.
I5
,
E8
،
2012
23. Formal verification :
Author: Erik Seligman, Tom Schubert, M.V. Achutha Kiran Kumar
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electronic circuits-- Testing,Integrated circuits-- Very large scale integration-- Design and construction,Verilog (Computer hardware description language)
Classification :
TK7867
24. Formal verification : an essential toolkit for modern VLSI design
Author: Seligman, Erik
Library: Library of Institute for Research in Fundamental Sciences (Tehran)
Subject: Testing ، Electronic circuits,Design and construction ، Integrated circuits -- Very large scale integration,، Verilog )Computer hardware description language(
Classification :
TK
7867
.
S46F6
25. Genetic algorithms for VLSI design, layout & test automation
Author: Mazumder, Pinaki., Pinaki Mazumder, Elizabeth M. Rudnick
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: ، Integrated circuits, Very large scale integration, Design and construction,، Integrated circuits, Very large scale integration, Testing,، Genetic algorithms,، Integrated circuit layout
Classification :
TK
7874
.
75
.
M39G4
2007
26. Genetic algorithms for VLSI design, layout & test automation
Author: Mazumder, Pinaki
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: Very large scale integration Testing ، Integrated circuits,، Genetic algorithms,Very large scale integration Design and construction ، Integrated circuits
Classification :
TK
7874
.
75
.
M39
27. Genetic algorithms for VLSI design, layout & test automation
Author: Mazumder, Pinaki.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration -- Design and construction ، Integrated circuits,Very large scale integration -- Testing ، Integrated circuits,، Genetic algorithms,، Integrated circuit layout
Classification :
TK
7874
.
75
.
M39
2007
28. Hierarchical modeling for VLSI circuit testing
Author: Bhattacharya, Debashis
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Testing ، Integrated circuits,Very large scale integration - Computer simulation ، Integrated circuits
Classification :
TK
7874
.
B484
1990
29. Hierarchical modeling for VLSI circuit testing
Author: Bhattacharya, Debashis
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Integrated circuits-- Very large scale integration-- Testing,، Integrated circuits-- Very large scale integration-- Computer simulation
Classification :
TK
7874
.
B484
1990
30. Hierarchical modeling for VLSI circuit testing
Author: Bhattacharya, Debashis, 1691-
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Integrated circuits- Very large scale integration- Testing,، Integrated circuits- Very large scale integration- Computer simulation
31. High-level test synthesis of digital VLSI circuits
Author: Lee, Mike Tien-Chien
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Integrated circuits-- Very large scale integration-- Design and construction-- Data processing,، Integrated circuits-- Very large scale integration-- Testing-- Data processing,، Computer-aided design,، Digital integrated circuits-- Testing-- Data processing
Classification :
TK
7874
.
75
.
L44
1997
32. IDDQ testing of VLSI circuits
Author: / edited by Ravi K. Gulati and Charles F. Hawkins
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing,Metal oxide semiconductors, Complementary - Testing,Iddq testing
Classification :
TK
7874
.
I3223
1993
33. #Introduction to I_D_D_Q testing
پدیدآورنده : #by Sreejit Chakravarty and Paul J. Thadikaran
موضوع : Iddq testing ،Digital integrated circuits- Testing ،Integrated circuits- Very large scale integration- Testing
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
34. Introduction to VLSI testing
Author: Robert J. Feugate, Jr., Steven M. McIntyre
Library: Central Library and Information Center of Shahed University (Tehran)
Subject: Integrated circuits--Very large scale integration--Testing
Classification :
TK
،
7874
،.
F48
،
1988
35. Introduction to VLSI testing
Author: / Robert J. Feugate, Jr., Steven M. McIntyre
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing
Classification :
TK
7874
.
F48
1988
36. Introduction to VLSI testing
Author: Feugate, Robert J.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Integrated circuits-- Very large scale integration-- Testing
Classification :
TK
7874
.
F48
1988
37. Introduction to VLSI testing
Author: Feugate, Robert J.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Testing ، Integrated circuits
Classification :
TK
7874
.
F48
1988
38. LSI/VLSI testability design
Author: Tsui, Frank F.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Large scale integration - Testing ، Integrated circuits,Very large scale integration - Testing ، Integrated circuits
Classification :
TK
7874
.
T78
1987
39. #LSI/VLSI testability design
پدیدآورنده : #Frank F. Tsui
موضوع : Integrated circuits -- Large scale integration -- Testing ،Integrated circuits -- Very large scale integration -- Testing
۴ نسخه از این کتاب در ۴ کتابخانه موجود است.
40. Power- constrained testing of VLSI circuits
Author: Nicolici, Nicola
Library: (Semnan)
Subject: Testing ، Integrated circuits, Very large scale integration,Protection ، Integrated circuits, Very large scale integration,Thermal properties ، Semiconductors
Classification :
TK
7874
.
75
.
N5P6
